Ключевые слова: power equipment, HTS, Bi2223, cables coaxial, measurement setup, critical current, cores, shields, current-voltage characteristics, measurement technique
Ключевые слова: power equipment, HTS, Bi2223, tapes, comparison, cables, critical caracteristics, current-voltage characteristics, critical current, n-value, test results
Matsushita T., Otabe E.S., Kiuchi M., Ichiki Y., Ni B., Hu N., Akasaka T., Ma T., Kinoshita Y., Yonenaka T.
Ключевые слова: power equipment, power transmission lines, dc performance, HTS, YBCO, tapes, cables, design, new, current, angular dependence, shields, multilayered structures, experimental results, numerical analysis
Ключевые слова: HTS, GdBCO, YGdBCO, coated conductors, pinning arrays artificial, nanoscaled effects, nanorods, anisotropy, relaxation, TFA-MOD process, critical caracteristics, critical current density, angular dependence, Jc/B curves, magnetic field dependence, upper critical fields, current-voltage characteristics, pinning force, thickness dependence
Ключевые слова: MgB2, bulk, magnets, geometry effects, trapped field, numerical analysis, trapped field distribution
Matsushita T., Matsushita T., Otabe E.S., Otabe E.S., Kiuchi M., Kiuchi M., Vyatkin V.S., Vyatkin V.S., Yoshitomi K., Yoshitomi K., Mizukami S., Mizukami S.
Ключевые слова: MgB2, magnets, bulk, trapped field, numerical analysis, modeling, trapped field distribution
Ключевые слова: power equipment, cables, dc performance, fluctuations, ac losses, Bi2223, HTS, numerical analysis, ripple
Izumi T., Shiohara Y., Matsushita T., Otabe E.S., Kiuchi M., Kato T., Yoshizumi M., Tanabe K., Tobita H., Nagamizu H., Yokoe D.
Ключевые слова: HTS, cables coaxial, dc performance, modeling, numerical analysis, critical current, angular dependence
Ключевые слова: HTS, cables, dc performance, ac losses, fluctuations, modeling, numerical analysis, ripple
Izumi T., Shiohara Y., Matsushita T., Otabe E.S., Kiuchi M., Kato T., Yoshizumi M., Tanabe K., Tobita H., Nagamizu H., Yokoe D.
Ключевые слова: power equipment, HTS, cables, dc performance, twisting, shielding effects, modeling, YBCO, thickness dependence, substrate LaAlO3, critical caracteristics, Jc/B curves
Izumi T., Shiohara Y., Matsushita T., Otabe E.S., Kiuchi M., Takahashi Y., Kato T., Miura M., Koida T., Minami J.
Nagaya S., Kashima N., Watanabe T., Matsushita T., Otabe E.S., Kiuchi M., Takahashi Y., Shikimachi K.
Ключевые слова: oxypnictides, critical caracteristics, critical current, bulk, Jc/B curves, temperature dependence, experimental results
Nagaya S., Kashima N., Watanabe T., Matsushita T., Otabe E.S., Kiuchi M., Takahashi Y., Shikimachi K.
Ключевые слова: HTS, REBCO, coated conductors, ac losses, geometry effects, stacked blocks, critical caracteristics, Jc/B curves, experimental results
Ayai N., Hayashi K., Matsushita T., Otabe E.S., Kiuchi M., Sato K., Kikuchi M., Ueno S., Yamashita S.
Ключевые слова: MgB2, bulk, critical caracteristics, Jc/B curves, irreversibility fields, percolation model, angular dependence, pinning force, grain size, modeling, nucleation
Ключевые слова: HTS, YBCO, doping effect, REBCO, pinning, nanoparticles, nanoscaled effects, coated conductors, TFA-MOD process, flux creep, flux flow, modeling, pinning centers artificial, critical caracteristics, Jc/B curves, angular dependence, current-voltage characteristics, n-value, experimental results
Mito T., Matsushita T., Otabe E.S., Kiuchi M., Kawagoe A., Sumiyoshi F., Yanagi N., Kawabata S., Takahashi M., Wakuda T., Wakabayashi Y., Matsushima K., Yoshidome Y.
Shiohara Y., Matsushita T., Otabe E.S., Kiuchi M., Yamada Y., Miyata S., Ibi A., Himeki K., Matsutani F.
Nagaya S., Kashima N., Shiohara Y., Watanabe T., Matsushita T., Otabe E.S., Kiuchi M., Yamada Y., Shikimachi K., Himeki K.
Ayai N., Hayashi K., Matsushita T., Otabe E.S., Kiuchi M., Sato K., Kikuchi M., Takayama S., Ueno S.
Matsushita T., Otabe E.S., Kiuchi M., Muralidhar M., Hasan M.N.(hasan@aquarius10.cse.kyutech.ac.jp)
Ключевые слова: HTS, REBCO, composites, pinning, bulk, Jc/B curves, peak effect, experimental results, critical caracteristics
Hayashi K., Shiohara Y., Matsushita T., Kiuchi M., Sato K., Yamada Y., Fujikami J., Kimura K., Takayama S.
Shiohara Y., Matsushita T., Otabe E.S., Kiuchi M., Yamada Y., Konishi H., Miyata S., Ibi A., Yoshida T., Shibata M., Futamura M.
Ключевые слова: HTS, YBCO, coated conductors, critical current density, thickness dependence, n-value, irreversibility fields, flux creep, modeling, current-voltage characteristics, Jc/B curves, PLD process, IBAD process, experimental results, critical caracteristics, fabrication, magnetic properties
Hayashi K., Matsushita T., Otabe E.S., Kiuchi M.(kiuchi@cse.kyutech.ac.jp), Sato K., Fujikami J.
Otabe E.S., Kiuchi M., Ni B.(nee@fit.ac.jp), Hakoda S.
Ключевые слова: transformers, HTS, Bi2223, tapes, dc performance, prototype, test results, power equipment
Kiuchi M., Himeda Y., Sato K., Matsushita T.(matusita@cse.kyutech.ac.jp), Fujikami J.*2 Hayashi K.
Ключевые слова: HTS, Bi2223/Ag, overpressure processing, Jc/B curves, temperature dependence, angular dependence, n-value, irreversibility fields, current-voltage characteristics, magnetic field dependence, anisotropy, numerical analysis, experimental results, comparison, critical caracteristics, fabrication, magnetic properties
Haken B., Kiuchi M., Itoh K., Goldacker W., Katagiri K., Noto K., Ochiai S., Kuroda T.(kuroda.tsuneo@nims.go.jp), Haessler W., Otabe S., Shin H.S.*10, Sosnowski J.*11, Weijers H.*12, Wada H.*13, Kumakura K.
Muroga T., Kiss T., Shiohara Y., Watanabe T., Watanabe T., Otabe E.S., Kiuchi M., Fukumoto Y., Yamada Y., Miyata S., Yamauchi K., Matsushita T.(matusita@cse.kyutech.ac.jp), Ibi A.
Kiuchi M., Wada H., Matsushita T.(matusita@cse.kyutech.ac.jp), Yasuda T., Uchiyama T., Iguchi I.
Muroga T., Shiohara Y., Kiuchi M., Yamada Y., Miyata S., Matsushita T.(matusita@cse.kyutech.ac.jp), Ibi A., Kimura K.
Otabe E.S., Kiuchi M., Himeda Y., Matsushita T.(matusita@cse.kyutech.ac.jp)
Matsushita T., Kiuchi M., Himeda Y., Fujikami J., Hayashi K.(hayashi-kazuhiko@sei.co.jp)
Matsushita T., Otabe E.S., Kiuchi M.(kiuchi@cse.kyutech.ac.jp), Himeda Y., Fukumoto Y.
Matsushita T., Kiuchi M., Nadami T.(nadami@aquarius10.cse.kyutech.ac.jp), Otabe E.S.(otabe@cse.kyutech.ac.jp)
Ключевые слова: HTS, coated conductors, measurement technique, critical current density, critical caracteristics, width, harmonics impact
Iijima Y., Kiss T., Saitoh T., Inoue M., Matsushita T., Kakimoto K., Otabe E.S., Kiuchi M., Fukumoto Y.(fukumoto@aquarius10.cse.kyutech.ac.jp), Sawa H.
Matsushita T., Otabe E.S., Kiuchi M.(kiuchi@cse.kyutech.ac.jp), Kitaguchi H., Kumakura H., Okada M., Tanaka K., Yamauchi K., Kurokawa T.
Iijima Y., Kiss T., Saitoh T., Inoue M., Kuga T., Matsushita T., Kakimoto K., Otabe E.S., Yamauchi K.(yamauchi@aquarius10.cse.kyutech.ac.jp), Kiuchi M.
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